MIL-DTL-11352K(AT)
4.6 Methods of inspection.
4.6.1 Materials, design and construction. Conformance to 3.2 through 3.3.2.2 shall be
determined by inspection of contractor records providing proof or certification that design,
construction, processing, and materials conform to requirements. Applicable records shall
include drawing, specification, design data, receiving inspection records, processing and quality
control standards, vendor catalogs and certifications, industry standards, test reports, and rating
data.
4.6.2 Examination. Conformance to 3.3, 3.3.1, 3.5.1, 3.6.1, and 3.6.2, shall be
determined by examination for the defects listed in table IV. Examination shall be visual or by
measurement with SIE.
4.6.3 Operating requirements verification.
4.6.3.1 Photopic transmittance. To determine conformance to 3.4.1, the vision block
shall be tested in accordance with the following:
a. Apparatus. One of the following systems shall be utilized:
(1) Constant current tungsten lamp, monochrometer, and detector
(2) Double beam spectrophotometer
(3) Pritchard type photometer
b. Measurement. The wavelength range for this measurement is 380 nanometers (nm)
to 760 nm. Photopic transmittance shall be derived from multiplying measured
spectral transmission data, taken every 10 nm or less, by the photopic luminous
efficiency values and the output characteristics of CIE source C or A (see
ASTM E308). Photopic transmittance shall be measured along the optical axis using
Commission Internationale del Eclair (CIE) iluminant C or A.
c. Calculation. The photopic transmittance (P.T.) is derived from:
760
760
X T ( )S ( )V ( )d
Y S ( )V ( )d
and
380
380
P.T. = X/Y
where,
= The mathematical summation symbol
= wavelength
T() = Filter transmission with wavelength
S() = CIE source C or A characteristic (1931)
V() = Photopic visibility function (1931)
d = 10 nm intervals or less
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